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Intellectual Property
     
ID:   11315
IP Type:   Licensable Technology
Title:   A method for the accurate measure of thin layered structures in X-ray computer tomography.
Inventor:   Reilly, John J.; Silverman, Edwin ; Westin, Carl-Fredrik ; Kikinis, Ron ; Estepar, Raul San Jose; Washko, George
Summary:   The Technology: The inventors have created a new technique for CT image analysis which provides accurate, reproducible quantitative measurement of thin-layered and fine structures. Applications: In addition to drug screening applications, this method can be used in the following clinical: - Measurement of airway wall thickness in the lungs, which correlate with clinical indices of such lung diseases as COPD. - Quantitative assessments of coronary artery narrowing for diagnosis of heart disease and evaluation of disease progression. - Quantification of lung nodule size. - Quantitative assessments of the amount of cartilage in normal and injured joints. Advantages: - This technique provides accurate measurement of very small structures, which is not possible using current edge detection methods. - Because this new method is less subject to image noise than currently available techniques, it may require a lower radiation dose for image acquisition than what is currently required. - The method is adaptable to any make or model CT scanner. Publications: R. San Jose Estepar, G. Washko, E. Silverman, J. Reilly, R. Kikinis, C-F Westin, Accurate Airway Wall Estimation Using Phase Congruency, Lecture Notes in Computer Science, vol. 4191, pp. 125-134, 2006
Tech Type:   Medical Imaging
URL:   http://www.partners.org/techtransfer/availabletechnologies/default.asp
Contact:   Andrew Warner, AJWARNER@partners.org, 617-954-9380
Organization:   Brigham and Women's Hospital
 
 

Display all intellectual properties for Reilly, John J.; Silverman, Edwin ; Westin, Carl-Fredrik ; Kikinis, Ron ; Estepar, Raul San Jose; Washko, George
Display all intellectual properties for Brigham and Women's Hospital